华南理工大学学报(自然科学版) ›› 2015, Vol. 43 ›› Issue (11): 81-86.doi: 10.3969/j.issn.1000-565X.2015.11.012

• 材料科学与技术 • 上一篇    下一篇

基于卷对卷矩形靶的溅射膜厚均匀性控制

黄云翔1,温万昱1,张佳伟1,槐创锋1,曾海峰2,钟褔回2   

  1. 1. 华南理工大学 表面功能结构先进制造广东普通高校重点实验室,广东 广州 510640;2. 阳江市汉能工业有限公司 铜铟镓硒(CIGS)薄膜太阳能电池研制及推广中心,广东 阳江 529533
  • 收稿日期:2015-04-03 修回日期:2015-06-11 出版日期:2015-11-25 发布日期:2015-10-01
  • 通信作者: 黄云翔( 1987-) ,男,博士生,主要从事薄膜太阳电池、溅射镀膜、电化学沉积等的研究 E-mail:282092874@qq.com
  • 作者简介:黄云翔( 1987-) ,男,博士生,主要从事薄膜太阳电池、溅射镀膜、电化学沉积等的研究
  • 基金资助:
    广东省战略性新兴产业核心技术攻关项目(2012A032300009);华南理工大学中央高校基本科研业务费专项资
    金资助项目(2014ZM0025)

Thickness Uniformity Control of Sputtered Film Based on Roll-to-Roll System with a Rectangular Target

Huang Yun-xiang1 Wen Wan-yu1 Sun Jia-wei 1 Huai Chuang-feng1 Zeng Hai-feng2 Zhong Fu-hui 2   

  1. 1. Key Laboratory for Surface Functional Structure Manufacturing,South China University of Technology,Guangzhou 510640,Guangdong,China; 2. Yangjiang Henergy Industrial Co.,Ltd.,Centre of Fabrication and Promotion for CIGSSolar Cells,Yangjiang 529533,Guangdong,China
  • Received:2015-04-03 Revised:2015-06-11 Online:2015-11-25 Published:2015-10-01
  • Contact: 黄云翔( 1987-) ,男,博士生,主要从事薄膜太阳电池、溅射镀膜、电化学沉积等的研究 E-mail:282092874@qq.com
  • About author:黄云翔( 1987-) ,男,博士生,主要从事薄膜太阳电池、溅射镀膜、电化学沉积等的研究
  • Supported by:
    Supported by the Strategic Emerging Industry Core Technology Research Project of Guangdong Province
    (2012A032300009)

摘要: 提出一种基于卷对卷矩形靶的溅射理论模型,借助 Matlab 模拟仿真软件,对卷绕柔性衬底(宽度为 100mm,弯曲半径为 100mm,弯曲角为 80°)的膜厚均匀性进行分析. 首先,在主辊静态条件下,改变靶材几何尺寸和靶基距,研究此时膜厚均匀性误差的分布情况,发现:膜厚均匀性误差随着靶材几何尺寸的变大而整体减小;随着靶基距的增大,均匀性误差的中部先增大后减小,而两边一直减小. 其次,在主辊动态条件下,固定靶材几何尺寸,仅改变靶基距,研究此时膜厚均匀性误差的分布规律,发现:随着靶基距的增大,膜厚均匀性误差先增大后减小. 仿真实验结果还表明,动态膜厚均匀性误差位于静态膜厚均匀性误差分布曲线 Max-Min 的中部极值点与该分布曲线上参考点均值之间. 通过对文中模型的仿真,可以较快地预测基于卷对卷矩形靶的动态膜厚均匀性误差范围,大大减少膜厚均匀性的实验调试次数.

关键词: 矩形靶, 卷对卷, 真空磁控溅射, 膜厚均匀性, 仿真

Abstract: In this paper,a sputtered theoretical model is proposed on the basis of the roll-to-roll system with a rec-
tangular target,and with the help of the simulation software Matlab,it is used to analyze the film thickness uniformity of the rolled flexible substrate,whose width is 100mm with a bending radius of 100mm and a bending angle of 80°. First,in the stillness of main roller,the situation of the film thickness uniformity error is investigated by adjusting the geometry size of target and the substrate-to-target distance. The results show that the film thickness uniformity error as a whole decreases with the increase of the geometry size of target,and that as the substrate-to-target distance increases,the middle parts of the film thickness uniformity error first increase and then decrease,while both sides of the film thickness uniformity error decrease. Next,in the rolling condition,the distribution of the film thickness uniformity error is discussed by adjusting the substrate-to-target distance and keeping a constant geometry size of target. It is found that the film thickness uniformity error first increase and then decrease as the substrate-to-target distance increases. Simulaiton results also show that the rolling film thickness uniformity error locates between the middle maximum of the stilling film thickness uniformity error distribution curve Max-Min and the average of the reference points on this distribution curve. Through the simulation of the proposed model,the rolling film thickness uniformity error on the basis of the roll-to-roll system with a rectangular target can be predicted quickly and the number of debugging can be reduced significantly.

Key words: rectangular target, roll-to-roll, vacuum magnetron sputtering, film thickness uniformity, simulation

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