Journal of South China University of Technology (Natural Science Edition) ›› 2010, Vol. 38 ›› Issue (1): 65-69,86.doi: 10.3969/j.issn.1000-565X.2010.01.013

• Electronics, Communication & Automation Technology • Previous Articles     Next Articles

Vision-Based Inspection Algorithm for Chip Components

Zhang Wu-jieLi DiYe Feng2   

  1. 1. School of Automation Science and Engineering, South China University of Technology, Guangzhou 510640, Guangdong, China ; 2. School of Mechanical and Automotive Engineering, South China University of Technology, Guangzhou 510640, Guangdong, China
  • Received:2008-12-30 Revised:2009-06-28 Online:2010-01-25 Published:2010-01-25
  • Contact: 张舞杰(1970-),男,博士后,主要从事图像处理、模式识别、过程监控、嵌入式装备控制研究. E-mail:zwjllhtt@scut.edu.cn
  • About author:张舞杰(1970-),男,博士后,主要从事图像处理、模式识别、过程监控、嵌入式装备控制研究.
  • Supported by:

    中国博士后科学基金资助项目(20070420784);广东省自然科学基金博士科研启动项目

Abstract:

In order to automatically inspect chip components, a vision-based method is proposed to calculate the geometrical parameters of the components. In this method, first, the coarse location of chip components and the edge point sorting are realized by means of the maximum external rectangle method, and the precise location of the edge is implemented by using the Canny operator and the Zernike moment operator. Next, the edge points are sorted into 4 parts according to sorting points, which are then fitted respectively via line and arc fittings to obtain the corresponding accurate values. Moreover, the stripe direction of the transverse image of chip components is correctly judged according to the image characteristics obtained via the fast Fourier transform (FFT). Finally, an experiment is carried out, with a subpixel location precision of 0.03 pixel, a line fitting precision of O. 03 pixel, an arc fitting precision of 0. 05 pixel and a stripe direction accuracy of the transverse image of 100% being obtained. The results indicate that the proposed inspection method is of strong stability, high precision and excellent real-time perfor- mance, which is helpful in the automatic Vision-based inspection of chip components.

Key words: chip component, subpixel, vision inspection, fast Fourier transform, edge detection, fitting