Journal of South China University of Technology (Natural Science Edition) ›› 2007, Vol. 35 ›› Issue (10): 221-226.

• Electronics, Communication & Automation Technology • Previous Articles     Next Articles

Analytical Current and Capacitance Models of Polysilicon Thin-Film Transistors

Zheng Xue-ren  Deng Wan-ling  Chen Rong-sheng   

  1. Institute of Microelectronics , South China Univ. of Tech. , Guangzhou 510640 , Guangdong , China
  • Received:2007-03-01 Online:2007-10-25 Published:2007-10-25
  • Contact: Zheng Xue-ren (born in 1946) , male , professor,Ph. D. tutor , mainly researches on device modeling, A5IC design and simulation. E-mail:phxrzhen@scut. edu.cn
  • About author:Zheng Xue-ren (born in 1946) , male , professor,Ph. D. tutor , mainly researches on device modeling, A5IC design and simulation.

Abstract:

This paper presents a surface-potential-based analytical current and capacitance model of polysilicon thin-film transistors (poly-Si TTs) for circuit simulation , in which the non-iterative numerical algorithm is adopted to calculate the surface potential of poly-Si TFfs as a function of terminal voltage , thus greatly enhancing the efficiency of the proposed model. Based on the analytical calculation of surface potential and the charge sheet approach , the current-voltage model considering both the small geometry effects and the kink effect is developed. Moreover , a charge-based gate capacitance model is derived. It is indicated that the current and capacitance model is continuous and accurate across the linear and saturation regions without any unphysical interpolation scheme. A comparison between the data obtained by the model and those by experiments shows that the results accord well with each other , which verifies the correctness of the proposed model. S0 , it can be concluded that the proposed model is suitable for the incorporation into circuit simulators.

Key words: polysilicon thin-film transistor, surface potential, current model, capacitance model