Journal of South China University of Technology(Natural Science Edition) ›› 2023, Vol. 51 ›› Issue (3): 98-109.doi: 10.12141/j.issn.1000-565X.220324
Special Issue: 2023年电子、通信与自动控制
• Electronics, Communication & Automation Technology • Previous Articles Next Articles
WANG Xiaoqiang1,2 LI Bin1 DENG Chuanjin2 CHEN Si2 WANG Bin2 SU Wei2
Received:
2022-05-31
Online:
2023-03-25
Published:
2022-10-09
Contact:
邓传锦(1986-),男,高级工程师,主要从事集成电路可靠性寿命与环境试验研究。
E-mail:tjudeng@126.com
About author:
王小强(1982-),男,博士生,高级工程师,主要从事集成电路质量与可靠性测评研究。E-mail:ps_800@126.com
Supported by:
CLC Number:
WANG Xiaoqiang, LI Bin, DENG Chuanjin, et al. Thermal Fatigue Simulation and Reliability Analysis of High Density CCGA[J]. Journal of South China University of Technology(Natural Science Edition), 2023, 51(3): 98-109.
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