Journal of South China University of Technology(Natural Science) >
Thermal Fatigue Simulation and Reliability Analysis of High Density CCGA
Received date: 2022-05-31
Online published: 2022-10-09
Supported by
the Key Research and Development Project of Guangdong Provincial Science and Technology Department(2020B0404030005)
With the characteristics of excellent electrothermal performance and high-density signal interconnection, ceramic column grid array (CCGA) packaging is the first choice in highly reliable applications such as aerospace.When the pin exceeds 1 000, due to the packaging form and the characteristics of the material itself, high-density CCGA is more likely to fail in the environment of temperature change.The paper carried out temperature cycling test for CCGA1144 structure, and studied the stress distribution, variation law, failure cause and mode of welding column through microstructure observation and finite element simulation under the temperature cycling condition of -55~125 ℃. The results show that the variation range of total deformation, equivalent stress, equivalent elastic strain and plastic strain of outer ring welding column is larger than that of inner ring welding column in the process of temperature cycle, and it is more prone to failure, especially the edge welding column of outer ring. The paper identified the weakness of welding column in the thermal fatigue test and pointed out that the two sections of 0.15~0.60 mm and 2.17~2.43 mm are the dangerous areas of crack and fracture failure, and the latter section is more prone to crack and fracture. It put forward three failure modes of thermal fatigue of welding column, and pointed out that the welding column was damaged under the joint action of fatigue mechanism and creep mechanism. Suggestions on the direction of reinforcement and optimization design were given.The research results have guiding significance and reference value for the quality improvement, development and application of high-density CCGA.
Key words: CCGA; thermal fatigue; finite element; temperature cycle; failure
WANG Xiaoqiang, LI Bin, DENG Chuanjin, et al . Thermal Fatigue Simulation and Reliability Analysis of High Density CCGA[J]. Journal of South China University of Technology(Natural Science), 2023 , 51(3) : 98 -109 . DOI: 10.12141/j.issn.1000-565X.220324
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