Journal of South China University of Technology (Natural Science Edition) ›› 2020, Vol. 48 ›› Issue (8): 49-55.doi: 10.12141/j.issn.1000-565X.190515

• Electronics, Communication & Automation Technology • Previous Articles     Next Articles

Saliency Detection Based on Multi-Level Deep Features and Random Walk

CUI Dong1,2 WANG Ming1,2 LI Gang1,2 GU Guanghua1,2 LI Haitao1   

  1. 1. School of Information Science and Engineering,Yanshan University,Qinhuangdao 066004,Hebei,China; 2. Hebei Provincial Key Laboratory of Information Transmission and Signal Processing,Qinhuangdao 066004,Hebei,China
  • Received:2019-08-10 Revised:2020-04-10 Online:2020-08-25 Published:2020-08-01
  • Contact: 李刚(1979-),男,副教授,主要从事图像语义分类、模式识别、最佳离散信号设计研究。 E-mail:lg@ysu.edu.cn
  • About author:崔冬(1978-),女,教授,主要从事信息处理研究。E-mail:cuidong@ysu.edu.cn
  • Supported by:
    Supported by the National Natural Science Foundation of China (61303128),the Natural Science Foundation of Hebei Province ( F2017203169,F2018203239 ) and the Science and Technology Planning Project of Hebei Province(18210336)

Abstract: In order to solve the problems of incomplete feature learning and unobvious salient regions in complex scenes for the traditional saliency detection methods,a saliency detection algorithm based on multi-level deep fea-tures and random walk was proposed. Firstly,the fully convolutional networks (FCN) was used to perform multi-level convolution deep feature extraction on the image by combining the deep and shallow feature information. Se-condly,superpixels segmentation on the image was carried out and the extracted deep convolution features were assigned to the corresponding superpixels to construct a feature matrix. Finally,the final saliency map was generated by regularizing the random walk ranking model. The experimental results on the ECSSD and DUT-OMRON databases show that the proposed method has certain advantages in accuracy and F value,compared with the six representa-tive saliency detection algorithms.

Key words: saliency detection, multi-level deep features, feature extraction, random walk

CLC Number: