华南理工大学学报(自然科学版) ›› 2007, Vol. 35 ›› Issue (4): 72-76.

• 化学化工 • 上一篇    下一篇

温度对RTCVD 法制备多晶硅薄膜生长的影响

胡芸菲1  沈辉1† 柳锡运2  郭志球3 刘正义3   

  1. 1.中山大学 太阳能系统研究所,广东 广州 510006; 2. 华南理工大学 材料科学与工程学院,广东 广州 510640; 3. 华南理工大学 机械工程学院,广东 广州 510640
  • 收稿日期:2006-04-06 出版日期:2007-04-25 发布日期:2007-04-25
  • 通信作者: 沈辉,教授,博士生导师. shenhui1956@163.com E-mail:ofeifei@gmail. com
  • 作者简介:胡芸菲(1978-),工学博士,主要从事多晶硅薄膜晶体生长及硅太阳电池研究。
  • 基金资助:

    国家自然科学基金资助项目(50376067)

Effect of Temperature on Growth of Polycrystalline Silicon Thin Films Prepared via RTCVD

Hu Yun-fei1  Shen Hui1†  Liu Xi-yun2  Guo Zhi-qiu Liu Zheng-yi3   

  1. 1. Institute for Solar Energy Systems , Sun Yat-Sen Univ. , Guangzhou 510006 , Guangdong , China;2. School of Materials Science and Engineering , South China Univ. of Tech. , Guangzhou 510640 , Guangdong , China;3. School of Mechanical Engineering , South China Univ. of Tech. , Guangzhou 510640 , Guangdong , China
  • Received:2006-04-06 Online:2007-04-25 Published:2007-04-25
  • Contact: 沈辉,教授,博士生导师. shenhui1956@163.com E-mail:ofeifei@gmail. com
  • About author:胡芸菲(1978-),工学博士,主要从事多晶硅薄膜晶体生长及硅太阳电池研究。
  • Supported by:

    国家自然科学基金资助项目(50376067)

摘要: 多晶硅薄膜太阳电池是21 世纪最具发展潜力的薄膜太阳电池.如何快速、大面积、高质量地沉积多晶硅薄膜一直是多晶硅薄膜太阳电池研究中的一个核心问题.文中以SiHCl3 为硅源、B2H6为掺杂气,采用先进的快热化学气相沉积法( RTCVD) 制备了大晶粒的多晶硅薄膜.所制备的薄膜厚度为30 -40μm ,沉积速率达3 -7μm/ min. 文中还分析了沉积温度对多晶硅薄膜生长速率及晶体微观结构的影响.结果表明:当沉积温度在900 -1170℃时,平均生长速率随温度近似单调递增,此时薄膜生长由表面反应阶段控制;随着温度的升高,薄膜平均晶粒尺寸也由900℃时的不足3μm 增长到1170℃时的超过30μm;温度较低时,薄膜易向[220] 方向生长;温度达到1170℃时,多晶硅薄膜有向[111 ]方向生长的趋势.

关键词: 多晶硅, 薄膜, 沉积温度, 晶体生长, 晶体取向, 太阳电池

Abstract:

Polycrystalline silicon (poly-Si) thin films solar cells have been one of the thin-film solar cells with the greatest development potential. In the development of poly-Si thin-film solar cells , a key point is to fast deposit large and high-quality poly-Si thin films. Iri this paper , poly-Si thin films with large grains were prepared via the Rapid Thermal-Chemical Vapor Deposition (RTCVD) , with SiHC13 as the silicon source and B2H6 as the doping
gas. Thin films with a thickness of 30 - 40μm and a deposition rate of 3 - 7μm/min were thus obtained. The effect of deposition temperature on the growth rate of the film and the microstructure of the crystal was then investigated. It is concluded that , with the increase in deposition temperature from 900 to 1170℃ , the average growth rate ap-proximately exhibits a monotonous increase , the average crystal size increases from less than 3μm at 900℃ to more than 30μm at 1170℃, and the deposition is controlled by the surface reaction mechanism. Moreover , the poly-Si thin films tend to grow in [220] direction at low temperature while in [111] preferred orientation when the tem-perature reaches 1170℃ .

Key words: polycIγstalline silicon, thin film, deposition temperature, crystal growth, crystal orientation, solar cell