Electronics, Communication & Automation Technology

Design of Ultra-Wideband Active Magnetic Field Probe for Near-Field Measurement

Expand
  • 1. School of Electronic and Information Engineering, South China University of Technology,Guangzhou 510640,Guangdong,
    China; 2. Electronic Produce Reliability and Environmental Testing Research Institute, The Fifth Institute of Ministry of Industry and Information Technology, Guangzhou 510610, Guangdong, China
陈志坚(1979-),男,高级工程师,主要从事模拟射频集成电路前端研究。E-mail:chenzhijian@scut.edu.cn

Received date: 2020-06-11

  Revised date: 2020-12-07

  Online published: 2020-12-10

Supported by

Supported by the National Natural Science Foundation of China(62001123),the Key Realm Research & Development Program of Guangdong Province(2020B010179002,2018B010142001)and the Natural Science Foundation of Guangdong Province(2018A030310360)

Abstract

The current active probe, whose detection frequency is mainly concentrated in the low frequency band, cant meet the detection requirements of the high frequency band. Therefore, a small, high-bandwidth, non-contact active magnetic field probe was proposed. The active magnetic field probe is made of a multilayer printed circuit board (PCB). An active amplifier module and its supporting power management chip were added to the passive probe to improve the transmission gain of the ultra-wideband type probe. The probe was tested and analyzed from four aspects: frequency response, spatial resolution, calibration factor, and differential electric field suppression capability. The results show that the designed probe has a transmission gain of -20dB, a spatial resolution of 900μm, and is of good differential electric field suppression. The probe can be used for ultra-wideband PCB board and more complex integrated circuit measurements.

Cite this article

CHEN Zhijian, WANG Yuchen, HUANG Pengcheng, et al . Design of Ultra-Wideband Active Magnetic Field Probe for Near-Field Measurement[J]. Journal of South China University of Technology(Natural Science), 2021 , 49(6) : 131 -140 . DOI: 10.12141/j.issn.1000-565X.200312

Outlines

/