Energy, Power & Electrical Engineering

Recognition of Defects in Pins Based on Generative Adversarial Network and RetinaNet

  • WANG Jian ,
  • WANG Kai ,
  • LIU Gang ,
  • ZHOU Wen-Qing ,
  • ZHOU Zi-Kai
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  • School of Electric Power,South China University of Technology,Guangzhou 510640,Guangdong,China
王健(1965-) ,女,博士,副教授,主要从事电力市场研究。

Received date: 2019-06-17

  Revised date: 2019-08-27

  Online published: 2020-02-01

Supported by

Support by the General Program of the National Natural Science Foundation of China ( 51977083)

Abstract

Manually marking the defect of the pin in the aerial survey of the drone is a time-consuming and labor- intensive task. To solve this problem,the deep learning algorithm RetinaNet was used to realize the automatic labe- ling of defects in pins. Given that if the unclear data collected by the drone is directly detected,the problem of low recognition accuracy can not be avoided,so a method for intelligent identification of defects based on generative ad- versarial network was proposed. That is to improve the local texture,edge and other details by the mutual game be- tween the generator and the discriminator,so as to improve the quality of such pictures and combine the defect in- telligent recognition algorithm model to extract accurate features to achieve defect detection. Finally,since the fuzzy- clear picture for generating network training is difficult to obtain,a fuzzy-clear picture pair was constructed by com- bining Markov process and sub-pixel interpolation. The experimental results show that the RetinaNet show excellent performance when detecting clear pictures,but for fuzzy picture,it can also lead to detection error.The constructed fuzzy-clear picture pair can effectively train the generated confrontation network to have deblurring function,which is beneficial to the convolutional neural network to extract more abundant features,thereby further improving the recognition rate of blurred pictures.

Cite this article

WANG Jian , WANG Kai , LIU Gang , ZHOU Wen-Qing , ZHOU Zi-Kai . Recognition of Defects in Pins Based on Generative Adversarial Network and RetinaNet[J]. Journal of South China University of Technology(Natural Science), 2020 , 48(2) : 1 -8 . DOI: 10.12141/j.issn.1000-565X.190345

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