Recognition of Defects in Pins Based on Generative Adversarial Network and RetinaNet
Received date: 2019-06-17
Revised date: 2019-08-27
Online published: 2020-02-01
Supported by
Support by the General Program of the National Natural Science Foundation of China ( 51977083)
Key words: deep learning; generator; discriminator; Markov process; interpolation
WANG Jian , WANG Kai , LIU Gang , ZHOU Wen-Qing , ZHOU Zi-Kai . Recognition of Defects in Pins Based on Generative Adversarial Network and RetinaNet[J]. Journal of South China University of Technology(Natural Science), 2020 , 48(2) : 1 -8 . DOI: 10.12141/j.issn.1000-565X.190345
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