华南理工大学学报(自然科学版) ›› 2015, Vol. 43 ›› Issue (3): 98-102.doi: 10.3969/j.issn.1000-565X.2015.03.015

• 电子、通信与自动控制 • 上一篇    下一篇

低温溶液加工法制备氧化锌薄膜晶体管

兰林锋 宋威 史文 彭俊彪   

  1. 华南理工大学 发光材料与器件国家重点实验室,广东 广州 510640
  • 收稿日期:2014-09-23 修回日期:2014-12-08 出版日期:2015-03-25 发布日期:2015-02-10
  • 通信作者: 兰林锋 (1983-),男,博士,副研究员,主要从事薄膜晶体管研究. E-mail:lanlinfeng@scut.edu.cn
  • 作者简介:兰林锋 (1983-),男,博士,副研究员,主要从事薄膜晶体管研究.
  • 基金资助:

    国家“863”计划项目( 2014AA032702);国家自然科学基金资助项目(61204087,51173049,61306099);广州市珠江科技新星项目(2014J2200053);华南理工大学中央高校基本科研业务费专项资金资助项目(2014ZM0003,2014ZZ0028)

Fabrication of Zinc Oxide Thin Film Transistors via Low-Temperature Solution Processing

Lan Lin-feng Song Wei Shi Wen Peng Jun-biao   

  1. State Key Laboratory of Luminescent Materials and Devices,South China University of Technology,Guangzhou 510640,Guangdong,China
  • Received:2014-09-23 Revised:2014-12-08 Online:2015-03-25 Published:2015-02-10
  • Contact: 兰林锋 (1983-),男,博士,副研究员,主要从事薄膜晶体管研究. E-mail:lanlinfeng@scut.edu.cn
  • About author:兰林锋 (1983-),男,博士,副研究员,主要从事薄膜晶体管研究.
  • Supported by:
    Supported by the National High-tech R&D Program (863 Program)(2014AA032702) and the National Natural Science Foundation of China(NSFC)(61204087,51173049,61306099)

摘要: 为适应柔性有源有矩阵有机发光二极管(AMOLED)等新型显示技术发展的需要,将低温溶液处理的氧化锌作为半导体层、电化学氧化的氧化铝钕作为栅绝缘层,制备了氧化锌薄膜晶体管(TFT). 制备氧化锌半导体层所用的前驱体溶液为无碳的 Zn(OH)x -(NH3)y(2-x)+ 水溶液,这种氨络合物溶液制备简单、成本低,并且由于容易形成高活性的氢氧自由基,使得氨 - 金属之间的分解所需要的活化能较低,生成氧化锌所需的能量较小,可以在 180 ℃的较低温度下获得氧化锌多晶薄膜. 所制备的 TFT 器件的最高迁移率可达 0. 9cm2 /(V·s). 这种低温氧化锌薄膜工艺与室温电化学氧化的栅绝缘层工艺相结合,具有温度低和迁移率高的特点,完全能与柔性衬底兼容,在柔性显示中具有很大的应用前景.

关键词: 薄膜晶体管, 氧化锌, 低温溶液加工

Abstract:

In order to meet the requirements of novel display technologies such as flexible active-matrix organic light-emitting diodes (AMOLED),thin film transistors (TFTs) are fabricated,with low-temperature solution-pro-cessed ZnO as the semiconductor layer and with electrochemical oxidized alumina neodymium as the gate dielectric layer. In the preparation of ZnO semiconductor layer,carbon-free aqueous Zn(OH)x-(NH3)y(2-x)+ solution with low cost and fabrication simplicity is employed,and,more importantly,the energy for metal-ammine dissociation and ZnO formation is rather low thanks to the highly activated hydroxyl radicals. As a result,ZnO polycrystalline films can be realized at a relatively low temperature,namely 180℃. The proposed low-temperature solution-pro-cessed ZnO fabrication method combining with room-temperature electrochemically-oxidized gate dielectric layer helps achieve high mobility up to 0. 9 cm2 /(V·s),and is completely compatible with flexible substrates,so that it meets the demand of flexible electronic devices well.

Key words: thin film transistors, zinc oxide, low-temperature solution processing