华南理工大学学报(自然科学版) ›› 2006, Vol. 34 ›› Issue (5): 86-89.

• 材料科学与技术 • 上一篇    下一篇

利用光子探测分析法研究超微细材料表面特征

毕舒1 周曦亚1 郭国章2 谢先德2   

  1. 1.华南理工大学 材料科学与工程学院,广东 广州 510640;2,中国科学院 广州地球化学研究所,广东 广州 510640
  • 收稿日期:2005-04-13 出版日期:2006-05-25 发布日期:2006-05-25
  • 通信作者: 毕舒(1967-),男,副研究员,主要从事超细及纳米技术与材料、工艺和装备等研究 E-mail:imshubi@scut.edu.cn
  • 作者简介:毕舒(1967-),男,副研究员,主要从事超细及纳米技术与材料、工艺和装备等研究
  • 基金资助:

    广东省“十五”科技重大专项项目(2002A1070303)

Investigation into Surface Properties of Superfine M aterials via Photon-Detecting Analytics

Bi Shu1  Zhou Xi-ya1  Guo Guo-zhang2  Xie Xian-de2   

  1. 1.College of Materials Science and Engineering,South China Univ.of Tech.,Guangzhou 510640,Guangdong,China;2.Guangzhou Institute of Geochemistry,the Chinese Academy of Sciences,Guangzhou 510640,Guangdong,China
  • Received:2005-04-13 Online:2006-05-25 Published:2006-05-25
  • Contact: 毕舒(1967-),男,副研究员,主要从事超细及纳米技术与材料、工艺和装备等研究 E-mail:imshubi@scut.edu.cn
  • About author:毕舒(1967-),男,副研究员,主要从事超细及纳米技术与材料、工艺和装备等研究
  • Supported by:

    广东省“十五”科技重大专项项目(2002A1070303)

摘要: 采用光子探测分析法,对自制的两类超微细材料——超细重质碳酸钙粉体和以超细改性重质碳酸钙粉体为填料的聚氯乙稀塑料薄膜的粒径分布和表面形貌进行了研究,并将所得结果与采用传统的微区分析方法——扫描电子显微分析所得的结果进行比较.结果表明:对于亚微米材料的粒径分析,利用光子技术的动态光散射法更精确;对于超微细材料在塑料中的分散性能的研究,激光共聚焦扫描二维数字成像分析比扫描电镜具有更大的优越性.据此,得到了一种表征超微细材料表面特征的新方法,

关键词: 光子探测, 粒径, 测量, 光子成像, 超微细材料

Abstract:

The particle size distributions and morphologies of two self-prepared superfine materials,that is,the SH-perfine heavy calcium carbonate powder and the PVC plastic membrane modified with superfine heavy calcium car-bonate powder,were investigated by means of the photon-detecting analytics.The corresponding results are then compared with those obtained by the traditional micro.zone analytics.SEM.The results indicate that the photon detection with dynamic light scattering is suitable for the analysis of particle size distribution of sub-micro superfine materials,while the laser condensing and focusing scanner with plane digital image are more suitable for the investigation of the dispersion of superfine material in plastic,as compared with SEM.Thus,a new analytical method is proposed for the investigation of surface properties of superfine materials.

Key words: photon detection, particle size, measurement, photon image capturing, superfine material