收稿日期: 2014-09-23
修回日期: 2014-12-08
网络出版日期: 2015-02-10
基金资助
国家“863”计划项目( 2014AA032702);国家自然科学基金资助项目(61204087,51173049,61306099);广州市珠江科技新星项目(2014J2200053);华南理工大学中央高校基本科研业务费专项资金资助项目(2014ZM0003,2014ZZ0028)
Fabrication of Zinc Oxide Thin Film Transistors via Low-Temperature Solution Processing
Received date: 2014-09-23
Revised date: 2014-12-08
Online published: 2015-02-10
Supported by
Supported by the National High-tech R&D Program (863 Program)(2014AA032702) and the National Natural Science Foundation of China(NSFC)(61204087,51173049,61306099)
兰林锋 宋威 史文 彭俊彪 . 低温溶液加工法制备氧化锌薄膜晶体管[J]. 华南理工大学学报(自然科学版), 2015 , 43(3) : 98 -102 . DOI: 10.3969/j.issn.1000-565X.2015.03.015
In order to meet the requirements of novel display technologies such as flexible active-matrix organic light-emitting diodes (AMOLED),thin film transistors (TFTs) are fabricated,with low-temperature solution-pro-cessed ZnO as the semiconductor layer and with electrochemical oxidized alumina neodymium as the gate dielectric layer. In the preparation of ZnO semiconductor layer,carbon-free aqueous Zn(OH)x-(NH3)y(2-x)+ solution with low cost and fabrication simplicity is employed,and,more importantly,the energy for metal-ammine dissociation and ZnO formation is rather low thanks to the highly activated hydroxyl radicals. As a result,ZnO polycrystalline films can be realized at a relatively low temperature,namely 180℃. The proposed low-temperature solution-pro-cessed ZnO fabrication method combining with room-temperature electrochemically-oxidized gate dielectric layer helps achieve high mobility up to 0. 9 cm2 /(V·s),and is completely compatible with flexible substrates,so that it meets the demand of flexible electronic devices well.
/
| 〈 |
|
〉 |